首页> 外国专利> Fluorescence intensity correction method, fluorescence intensity calculation method, and fluorescence intensity calculation device and fluorescence intensity correction program

Fluorescence intensity correction method, fluorescence intensity calculation method, and fluorescence intensity calculation device and fluorescence intensity correction program

机译:荧光强度校正方法,荧光强度计算方法,荧光强度计算装置和荧光强度校正程序

摘要

A fluorescence intensity correction method including: receiving fluorescence emitted from fluorescent pigments, collecting detected values from each light detector, and obtaining a fluorescence spectrum of each fluorescent pigment as one spectrum group; separating the obtained spectrum group into a plurality of small spectrum groups; comparing the separated small spectrum groups with a fluorescence wavelength distribution of each fluorescent pigment obtained in advance and specifying the small spectrum groups as the fluorescence spectrum of any fluorescent pigment; comparing a differential spectrum between small spectrum groups that are not specified and one or more specified small spectrum groups with the fluorescence wavelength distribution of unspecified fluorescent pigments obtained in advance, and specifying the differential spectrum as the fluorescence spectrum of any fluorescent pigment; and calculating the intensity of fluorescence emitted from each fluorescent pigment.
机译:一种荧光强度校正方法,包括:接收从荧光颜料发出的荧光,收集来自每个光检测器的检测值,并获得每个荧光颜料的荧光光谱作为一个光谱组。将获得的频谱组分为多个小频谱组;将分离的小光谱组与预先获得的每种荧光颜料的荧光波长分布进行比较,并将小光谱组指定为任何荧光颜料的荧光光谱;比较未指定的小光谱组和一个或多个指定的小光谱组之间的差异光谱与预先获得的未指定的荧光颜料的荧光波长分布,并将该差异光谱指定为任何荧光颜料的荧光光谱;计算每种荧光颜料发出的荧光强度。

著录项

  • 公开/公告号US8629412B2

    专利类型

  • 公开/公告日2014-01-14

    原文格式PDF

  • 申请/专利权人 YOSHITSUGU SAKAI;

    申请/专利号US201113196102

  • 发明设计人 YOSHITSUGU SAKAI;

    申请日2011-08-02

  • 分类号G01J1/58;

  • 国家 US

  • 入库时间 2022-08-21 16:00:40

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