首页> 外国专利> the method of assessment on the kinetics of education u043du0430u043du043eu0440u0430u0437u043cu0435u0440u043du044bu0445 films and their optical characteristics

the method of assessment on the kinetics of education u043du0430u043du043eu0440u0430u0437u043cu0435u0440u043du044bu0445 films and their optical characteristics

机译:教育动力学 u043d u0430 u043d u043e u0440 u0430 u0437 u043c u0435 u0440 u043d u044b u0445膜的评估方法及其光学特性

摘要

the invention relates to a method to assess the kinetics of education and changes the optical properties of u043du0430u043du043eu0440u0430u0437u043cu0435u0440u043du044bu0445 films formed in the condensation products the hot u0433u0430u0437u043eu0432u044bu0434u0435u043bu0435u043du0438u044f non-metallic materials in a vacuum. the main objective of the method is to increase the number of parameters to be monitored u043au043eu043du0434u0435u043du0441u0438u0440u0443u044eu0449u0438u0445u0441u044f films to increase significantly the u0444u0443u043du043au0446u0438u043eu043du0430u043bu044cu043d s possible way.the technical result is achieved by that the way of evaluating the kinetics of education u043du0430u043du043eu0440u0430u0437u043cu0435u0440u043du044bu0445 films and changes their optical characteristics is in terms u0430u043au0443u0443u043cu043du043eu043c effects at a certain temperature for the samples placed in a special insulated containers and in the capture of about u0432u044bu0434u0435u043bu0438u0432u0448u0438u0445u0441u044f u0440u0430u0437u0446u043eu0432 easily u043au043eu043du0434u0435u043du0441u0438u0440u0443u044eu0449u0438u0445u0441u044f substances on the u043au043eu043du0434u0435u043du0441u0438u0440u0443u044eu0449u0438u0445 plates.the loss of mass determined from the difference of masses samples before and after exposure, and thus similar to determine the content of volatile u043au043eu043du0434u0435u043du0441u0438u0440u0443u044eu0449u0438u0445u0441u044f substances.the condensing plate of quartz glass are placed in a special holder u043eu0445u043bu0430u0436u0434u0430u0435u043cu044bu0439 to temperatures in the range from - 30 to + 50 degrees c; in the bottom window vacuum chamber with a source of radiation with lengths up u043cu043eu043du043eu0445u0440u043eu043cu0430u0442u0438u0447u0435u0441u043au043eu0433u043e waves ranging from 140 to 3300 nm, and in the upper window of the radiation receiver.the cameras are located on opposite sides of u0441u043eu043eu0441u043du043e test sample so that the axis passing through the center of the window coincides with the center of the sample; test the ilb. u0430u0437u0435u0446 are heated to the temperature for 0.1% below the minimum threshold temperature at which begins u0434u0435u0441u0442u0440u0443u043au0446u0438u044f non-metallic materialthere is a continuous radiation pattern glass u043cu043eu043du043eu0445u0440u043eu043cu0430u0442u0438u0447u0435u0441u043au0438u043c flow and the energy and frequency u043cu043eu043du043eu0445u0440u043eu043cu0430u0442u0438u0447u0435u0441u043au043eu0433u043e the flow. kinetics of formation and optical properties of the films changes by changing the transmission factor, and frequency characteristics of the radiation, p u0440u043eu0448u0435u0434u0448u0435u0433u043e through u043au043eu043du0434u0435u043du0441u0430u0446u0438u043eu043du043du0443u044e polluting plate with film.
机译:本发明涉及一种评估教育动力学并改变在缩合产物中形成的薄膜的光学性质的方法,该光学性质真空中热的 u0433 u0430 u0437 u043e u0432 u044b u0434 u0435 u043b u0435 u043d u0438 u044f非金属材料。该方法的主要目的是将要监视的参数数量增加到 u043a u043e u043d u0434 u0435 u043d u0441 u0438 u0440 u0443 u044e u0449 u0438 u0445 u0444 u0441 u044e大大提高了 u0444 u0443 u043d u043a u0446 u0438 u043e u043d u0430 u043b u044c u043d的可能方法。通过评估教育动力学的方法获得了技术成果。 u043d u043e u0440 u0430 u0437 u043c u0435 u0440 u043d u044b u0445胶片并更改其光学特性是指 u0430 u043a u0443 u0443 u043c u043d u043d u043e u043c的效果放置在特殊绝缘容器中的样品的一定温度并捕获 u0432 u044b u0434 u0435 u043b u0438 u0432 u0448 u0438 u0445 u0441 u044f u0440 u0430 u0430 u0437 u0446 u043e u0432很容易地将 u043a u043e u043d u0434 u043f上的物质 u043a u043e u043d u043d u0434 u0435 u043d u0441 u0449 u0438 u0445 u0441 u044f u043d u0441 u0438 u0440 u0443 u0 44e u0449 u0438 u0445板。质量损失是由暴露前后的质量差异确定的,因此类似于确定挥发物的含量。 u043a u043e u043d u0434 u0435 u043d u0441 u0438 u0440 u0443 u044e u0449 u0438 u0445 u0441 u044f物质。石英玻璃的冷凝板放置在特殊的支架中 u043e u0445 u043b u0430 u0436 u0434 u0430 u0435 u043c u044b u0439至-30至+ 50摄氏度的温度;在底部窗口真空室中,其辐射源的长度为 u043c u043e u043d u043e u0445 u0440 u043e u043c u0430 u0442 u0438 u0447 u0435 u0441 u043a u043a u043e u0433 u043e波长介于140至3300 nm之间的光,并且位于辐射接收器的上方窗口中。摄像头位于测试样品的相对两侧,从而使轴穿过光源的中心窗口与样本中心重合;测试ilb。将 u0430 u0437 u0435 u0446加热到最低阈值温度以下0.1%的温度,该温度开始时为非金属材料 u0434 u0435 u0441 u0442 u0440 u0443 u043a u0446 u0438 u044f连续辐射图案玻璃 u043c u043e u043d u043e u0445 u0440 u043e u043c u0430 u0442 u0438 u0447 u0435 u0441 u043a u0438 u043c流量和能量和频率 u043c u043e u043d u043e u0445 u0440 u043e u043c u0430 u0442 u0438 u0447 u0435 u0441 u043a u043e u0433 u043e该流程。薄膜的形成动力学和光学性质会通过更改透射因子和辐射的频率特性而变化,p u0440 u043e u0448 u0435 u0434 u0448 u0435 u0433 u043e至 u043a u043e u043d u0434 u0435 u043d u0441 u0430 u0446 u0438 u043e u043d u043d u0443 u044e带有薄膜的污染板。

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