首页>
外国专利>
DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE
DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE
展开▼
机译:用于测量样品的共振非弹性X射线散射的装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
The invention relates to a device for measuring resonant inelastic x-ray scattering of a sample. The device has at least two reflection zone plates (1.RZP, 2.RZP) which are arranged to allow cross-dispersion, a sample to be examined (P) being located in the beam path behind the first reflection zone plate (1.RZP). A second reflection zone plate (2.RZP) disperses the radiation scattered by the sample perpendicular to the dispersion direction of the first reflection zone plate (1.RZP). In the focus of the exiting diffracted radiation of the second reflection zone plate (2.RZP) is arranged a means for two-dimensional detection (D) of the scattered radiation.
展开▼