SAMPLING APPARATUS FOR SEDIMENT SAMPLE CAPABLE OF MEASURING ENVIRONMENT CONDITIONS OF SAMPLING SITE AND METHOD FOR ANALYZING SEDIMENT SAMPLE USING SAME

摘要

The present invention relates to a sampling apparatus for sediment samples that samples sediment samples depth by depth with respect to an ocean sediment layer for a geological survey of the sediment layer. According to the present invention, provided is a sampling apparatus for sediment samples capable of measuring the environment conditions of a sampling site that is configured so that information with respect to the environment conditions of the sampling site such as the temperature and pressure at a sampling position can be measured with respect to each of the sediment samples during the depth-specific sampling of the sediment samples with respect to the sediment layer for the geological survey of the ocean sediment layer. In addition, the sediment samples are acquired at each depth along with the information on the environment conditions such as the temperature and pressure at the position, and then analysis is performed during an analysis operation for the samples such as ultrasonic pulse velocity measurement by using the information on the environment conditions at the sampling site with respect to each of the sediment samples. Accordingly, the post-correction of the related art that is performed after a laboratory condition analysis does not have to be performed, and the analysis can be performed with greater accuracy.;COPYRIGHT KIPO 2014