PROCESS CONTROL TEST Gamma-percent life non-reducing electronic devices With the exponential law of distribution of time to failure

摘要

A method of monitoring tests for gamma percent resource nonrestorable electronic devices with an exponential time distribution law to failure, according to which the tests are carried out single-stage method with a limited duration of the test and reduced to control the probability of non-occurrence of a limiting condition for a predetermined time as a limiting condition receiving refusal electronic device, selected duration tispytaniya limit value and a predetermined percentage of gamma resource, asschityvayut probability Rnenastupleniya failure in a time equal gamma percent resource is selected or calculated acceptance Pu the rejection Rznacheniya probability of non-occurrence of failure, depending on the P, P, manufacturer risk and risk consumer quantify nradioelektronnyh devices needed for testing and acceptance number Sotkazov in the process of testing the failed radio electronic devices do not replace, after the test is determined faulty radio electronic apparatus, characterized in that The number nuvelichivayut to m times, where m - is a positive integer greater than one, the thus obtained number of electronic devices are divided into equal groups of m electronic devices, tprinimayut equal to the decrease in m times a predetermined value gamma percentage resource of the failed electronic devices selected by one each group having a faulty radio electronic apparatus, wherein, if the total number thus selected electronic devices is less than or equal to C, the test results MF