首页> 外国专利> Method for manufacturing chips, involves providing back metal stack on laser absorption layer, irradiating laser absorption layer with laser light along dividing lines, and separating chips along dividing lines using covered division

Method for manufacturing chips, involves providing back metal stack on laser absorption layer, irradiating laser absorption layer with laser light along dividing lines, and separating chips along dividing lines using covered division

机译:芯片的制造方法,包括在激光吸收层上设置背面金属叠层,沿分割线向激光吸收层照射激光,并使用覆盖分割法沿分割线分离芯片。

摘要

The method involves providing a semiconductor wafer (12) comprising multiple chip areas (14a) that are separated by parting lines. Chip pads are arranged on a major surface (12a). A laser absorption layer (20) is provided on another major surface (12b) opposite to the former major surface. A back metal stack (18) is provided on the laser absorption layer. The laser absorption layer is irradiated with laser light along dividing lines, and chips (10) are separated along the dividing lines using covered division. The absorbent layer is healed completely before providing the back metal stack. Independent claims are also included for the following: (1) a chip (2) a semiconductor wafer.
机译:该方法包括提供半导体晶片(12),该半导体晶片(12)包括由分型线分开的多个芯片区域(14a)。芯片焊盘布置在主表面(12a)上。激光吸收层(20)设置在与前一个主表面相对的另一个主表面(12b)上。在激光吸收层上设置有背面金属叠层(18)。沿着分割线照射激光吸收层,并利用覆盖分割将芯片(10)沿着分割线分离。吸收层在提供背面金属叠层之前已完全愈合。还包括以下方面的独立权利要求:(1)芯片(2)半导体晶片。

著录项

  • 公开/公告号DE102013221822A1

    专利类型

  • 公开/公告日2014-02-13

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE201310221822

  • 发明设计人 MACKH GUNTHER;KOLLER ADOLF;

    申请日2013-10-28

  • 分类号H01L21/78;H01L21/3205;H01L23/28;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:10

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