首页> 外国专利> Method for transferring semiconductor layer on substrate receiver of semiconductor structure, involves forming barrier layer, and selecting thickness of barrier layer such that fracture face does not reach semiconductor layer

Method for transferring semiconductor layer on substrate receiver of semiconductor structure, involves forming barrier layer, and selecting thickness of barrier layer such that fracture face does not reach semiconductor layer

机译:在半导体结构的衬底接收器上转移半导体层的方法,包括形成阻挡层,并选择阻挡层的厚度以使断裂面不到达半导体层。

摘要

The method involves forming a containment layer (20) including chemical species. A barrier layer (30) presenting a chemical composition different from a semiconductor layer (40) is formed, where the barrier layer is in crystal lattice arrangement with the containment layer, and the composition limits diffusion of the species in the semiconductor layer. The semiconductor layer intended to be transferred is formed. Thickness of the barrier layer is selected such that a fracture face on the containment layer does not reach the semiconductor layer. The barrier layer is selectively engraved. An independent claim is also included for a semiconductor structure.
机译:该方法包括形成包括化学物质的容纳层(20)。形成具有不同于半导体层(40)的化学组成的阻挡层(30),其中该阻挡层与容纳层处于晶格排列,并且该组成限制了物种在半导体层中的扩散。形成要转移的半导体层。选择阻挡层的厚度,以使容纳层上的断裂面不到达半导体层。阻挡层被选择性地雕刻。对于半导体结构也包括独立权利要求。

著录项

  • 公开/公告号FR2993703A1

    专利类型

  • 公开/公告日2014-01-24

    原文格式PDF

  • 申请/专利权人 SOITEC;

    申请/专利号FR20120002097

  • 发明设计人 LALLEMENT FABRICE;FIGUET CHRISTOPHE;

    申请日2012-07-23

  • 分类号H01L21/762;H01L21/98;

  • 国家 FR

  • 入库时间 2022-08-21 15:36:35

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