RLG scale factor correction and lock-in measurement employing readout waveform distortion

摘要

The apparatus includes circuitry (30) coupled to at least one output signal of the ring laser for measuring a duration of a predetermined portion i.e. the positive signal part of a cycle of the output signal and for measuring a period of a cycle of the output signal. The duration of the predetermined portion, or positive excursion, is shown to be a function of the lock-in rate of the ring laser. The apparatus further includes circuitry for determining a ring laser scale factor nonlinearity compensation factor as a function of (a) the measured duration of the predetermined portion of a cycle of the output signal, (b) the measured duration of the period of the cycle of the output signal, and (c) a value of a ring laser bias.