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DEFECT IDENTIFICATION METHOD AND DEFECT IDENTIFICATION SYSTEM

机译:缺陷识别方法和缺陷识别系统

摘要

PROBLEM TO BE SOLVED: To provide a defect identification method and a defect identification system, capable of surely identifying a defective part of a coating film with high accuracy even if concentration of a fluorescent agent in coating liquid is reduced, at low cost.SOLUTION: While transporting a web W having a coating film CF containing a fluorescent agent, in a defect identification method for identifying a defective part during coating, the coating film is irradiated with ultraviolet light so as to straddle the web in the width direction, fluorescent light from an irradiation region IR of the ultraviolet light is detected and the detected ultraviolet light is analyzed to identify a defective part of the coating film.
机译:解决的问题:提供一种缺陷识别方法和缺陷识别系统,即使降低涂布液中荧光剂的浓度,也能够以高精度可靠地识别涂膜的缺陷部分。在运送具有包含荧光剂的涂膜CF的纤维网W的同时,在用于识别涂布过程中的缺陷部分的缺陷识别方法中,用紫外光照射涂膜以使其在宽度方向上跨过纤维网,检测紫外线的照射区域IR,并对检测到的紫外线进行分析,以确认涂膜的不良部位。

著录项

  • 公开/公告号JP2015152412A

    专利类型

  • 公开/公告日2015-08-24

    原文格式PDF

  • 申请/专利权人 LINTEC CORP;

    申请/专利号JP20140026186

  • 发明设计人 MORI TSUYOSHI;

    申请日2014-02-14

  • 分类号G01N21/89;B05D3/00;B05D5/06;

  • 国家 JP

  • 入库时间 2022-08-21 15:35:16

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