Spectroscopic measurement method, scattering-type near-field microscope, and method for manufacturing tip-enhanced Raman probe

摘要

PROBLEM TO BE SOLVED: To provide a spectrometry and a scattering type near field optical microscope which have a high enhancement degree, and a manufacturing method for a tip-enhanced raman probe with a high enhancement degree.;SOLUTION: A manufacturing method for a tip-enhanced raman probe includes the step of: preparing a silicon probe; oxidizing the probe; and forming a metal film on the oxidized probe. In the step of oxidizing the probe, the silicon is oxidized until getting a thickness where a plasmon resonance wavelength of the probe on which the metal film is formed and a wavelength of a pump laser become equal.;COPYRIGHT: (C)2013,JPO&INPIT