Quality priority circuit extraction equipment , quality priority circuit extraction method , quality priority circuit extraction program , mask making system , and layout constraints created system .

摘要

PROBLEM TO BE SOLVED: To extract a partial circuit giving priority to mask inspection quality, such as, a differential pair circuit and a current mirror circuit, by combining it with regular information on element arrangement on a layout.;SOLUTION: Priority order of mask inspection accuracy is decided for an element graphic, included in layout data from net list information (differential pair circuit and current mirror circuit) of a quality priority circuit which is extracted by a quality priority circuit net list extracting device 3, and layout information (row/column/array structure) of the quality priority circuit which is extracted by a quality priority circuit layout extracting device 5.;COPYRIGHT: (C)2011,JPO&INPIT