首页> 外国专利> Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package

Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package

机译:用于扫描探针传感器组件的安装座,扫描探针传感器组件,扫描探针显微镜以及安装或拆卸扫描探针传感器组件的方法

摘要

A mount for a scanning probe sensor package (27) comprises a support structure (1, 5) defining a plane within the mount and at least one movable snap joint element (9) designed for interacting with a respective counterpart (43) in a scanning probe sensor package (27). The snap joint element (9) is movable to a first position in which it exerts a force on a mounted scanning probe sensor package (27) so as to force said scanning probe sensor package (27) in a normal direction of said plane towards the support structure (1,5) and to a second position in which it allows a scanning probe sensor package (27) to be mounted to or dismounted from the support structure (1, 5) along normal direction of said plane.
机译:用于扫描探针传感器封装的支架( 27 )包括在支架中定义平面的支撑结构( 1、5 )和至少一个可移动的快速连接元件(< B> 9 )设计用于与扫描探针传感器封装( 27 )中的对应对象( 43 )进行交互。卡扣元件( 9 )可移动到第一位置,在该位置上,它会向已安装的扫描探针传感器组件( 27 )施加力,以迫使所述扫描探针传感器包装( 27 )沿所述平面的法线方向朝向支撑结构( 1,5 )并到达第二个位置,在该位置,扫描传感器包装( 27 )沿着该平面的法线方向安装到支撑结构( 1、5 )或从支撑结构上卸下。

著录项

  • 公开/公告号US8884222B2

    专利类型

  • 公开/公告日2014-11-11

    原文格式PDF

  • 申请/专利权人 JOERG RYCHEN;

    申请/专利号US201013502171

  • 发明设计人 JOERG RYCHEN;

    申请日2010-10-05

  • 分类号G01N23/00;G01Q70/02;B82Y35/00;

  • 国家 US

  • 入库时间 2022-08-21 15:19:57

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