首页> 外国专利> Detector arrangement and X-ray tomography device for performing phase-contrast measurements and method for performing a phase-contrast measurement

Detector arrangement and X-ray tomography device for performing phase-contrast measurements and method for performing a phase-contrast measurement

机译:用于执行相差测量的探测器装置和X射线断层摄影设备以及用于执行相差测量的方法

摘要

A detector arrangement is disclosed for performing phase-contrast measurements, including at least two transducer layers arranged one behind the other, wherein at least the first transducer layer arranged in the radiation direction includes alternate sensitive areas having a high absorptance for the conversion of incident radiation quanta into signals and less sensitive areas having a lower absorptance in comparison thereto. Further, a corresponding X-ray tomography device and a method for performing phase-contrast measurements are also enclosed.
机译:公开了一种用于执行相衬测量的探测器装置,该探测器装置包括至少两个彼此依次布置的换能器层,其中至少在辐射方向上布置的第一换能器层包括具有高吸收率的交替敏感区域,用于转换入射辐射量化为信号和与之相比具有较低吸收率的较不敏感区域。此外,还包括相应的X射线断层摄影设备和用于执行相差测量的方法。

著录项

  • 公开/公告号US8913714B2

    专利类型

  • 公开/公告日2014-12-16

    原文格式PDF

  • 申请/专利权人 THILO MICHEL;PETER BARTL;GISELA ANTON;

    申请/专利号US201013264554

  • 发明设计人 GISELA ANTON;PETER BARTL;THILO MICHEL;

    申请日2010-04-13

  • 分类号H05G1/64;H05G1/08;H01L27/148;H01L27/146;G01T1/29;G01N23/20;A61B6/00;

  • 国家 US

  • 入库时间 2022-08-21 15:18:26

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