首页> 外国专利> MICROWAVE INDUCED CHEMICAL ETCHING OF LR-115 TYPE-II SOLID STATE NUCLEAR TRACK DETECTOR

MICROWAVE INDUCED CHEMICAL ETCHING OF LR-115 TYPE-II SOLID STATE NUCLEAR TRACK DETECTOR

机译:微波诱导的LR-115 II型固态核磁探测器的化学腐蚀

摘要

A method of studying alpha particles using a solia polymeric track detector bearing created latent tracks is envisaged, wherein an etchant having a pre-determined concentration is pre-heated for a pre-determined time in an etchant bath at a pre-determined microwave power (wattage). The detector bearing latent tracks is then immersed in the pre-heated etchant and exposed to microwave radiation at a pre-determined power for a pre-determined time to develop the created latent tracks. The developed tracks are bright, clear and circular and easily discernible using a suitable visual device to enable studying of the alpha particles that created the latent tracks.
机译:设想了一种使用带有产生的潜在轨迹的太阳能聚合物轨迹检测器研究α粒子的方法,其中将具有预定浓度的蚀刻剂在蚀刻剂浴中以预定微波功率预加热预定时间(瓦数)。然后将带有检测器的潜迹线浸没在预热的蚀刻剂中,并以预定的功率暴露于微波辐射中一段预定的时间,以显影所产生的潜迹线。显影的轨道明亮,清晰,圆形,并且可以使用适当的视觉设备轻松辨认,以研究形成潜伏轨道的α粒子。

著录项

  • 公开/公告号IN2010DE03138A

    专利类型

  • 公开/公告日2014-11-21

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN3138/DEL/2010

  • 发明设计人 SONKAWADE RAJENDRA;VARSHNEY RATI;

    申请日2010-12-28

  • 分类号G01T3/00;

  • 国家 IN

  • 入库时间 2022-08-21 15:15:11

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