首页> 外国专利> ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANKS INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD AND PHOTOMASK

ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANKS INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD AND PHOTOMASK

机译:消融射线敏感或辐射敏感的树脂组合物,消融射线敏感或辐射敏感的膜,包括消融消隐射线的感光胶片,图案形成方法和光掩膜

摘要

An actinic ray-sensitive or radiation-sensitive resin composition includes; a compound (A) which generates an acid by irradiation with actinic rays or radiation, wherein the acid is linked with a group represented by the following general formula (M) through covalent bonding. In the formula, Y1 and Y2 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an alkenyl group, an alkynyl group, an aryl group, or an acyl group. Z represents a hydrogen atom or a substituent. * represents a linking site with a residue of the compound (A)
机译:光化射线敏感或辐射敏感的树脂组合物包括:化合物(A),其通过光化射线或放射线的照射而产生酸,其中该酸通过共价键与下述通式(M)表示的基团连接。式中,Y 1和Y 2各自独立地表示氢原子,烷基,环烷基,烯基,炔基,芳基或酰基。 Z表示氢原子或取代基。 *表示具有化合物(A)残基的连接位点

著录项

  • 公开/公告号KR20150004425A

    专利类型

  • 公开/公告日2015-01-12

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORPORATION;

    申请/专利号KR20147034031

  • 申请日2013-06-17

  • 分类号G03F7/038;G03F7/004;C07C309/65;C07C381/12;C07D327/08;H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 15:00:56

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