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FEED-THROUGH COIL UNIT, LONG COMPONENTS TEST DEVICE COMPLETE WITH ABOVE UNIT AND LONG COMPONENTS TEST METHOD

机译:馈通式卷纸装置,长部件试验装置,上部件完整法和长部件试验法

摘要

FIELD: electricity.SUBSTANCE: application: for the purpose of long components testing by eddy currents. The essence of the invention lies in the fact that a feed-through coil unit (100) intended for application in a long components test device by the continuous use of eddy currents is comprised of an excitation coil unit with the excitation coil (122) surrounding a passage opening (112) for passing of a long component (190) in the passage direction (192) and a pickup coil unit placed around the passage opening. The pickup coil unit includes two or several segment coil units (142-1/142-8) distributed along the periphery of the passage opening (112), at that each segment coil unit has a pickup area covering only a part of the surface for a long component. The segment coil units (142-1/142-8) are distributed along two shells (S1, S2) surrounding the passage opening placed at different distances (A1, A2) form the basic axis (114) of the feed-through coil unit. At that the first feed-through coil units (142-1/142-4) without mutual overlapping are placed in the first shell (S1), while the second feed-through coil units (142-5/142-8) without mutual overlapping are placed in the second shell (S2). The first and second feed-through coil units are placed with such shift in regard to each other that the second feed-through coil units measure the peripheral areas not covered by the first segment coil units.EFFECT: potential development of the high-strength feed-through coil that allows the receipt of reliable and informative test results on available defects and other inhomogeneities in the tested object.15 cl, 7 dwg
机译:领域:电力。物质:应用:用于通过涡流进行长零件测试的目的。本发明的实质在于以下事实:旨在通过连续使用涡流而在长部件测试设备中应用的直通线圈单元(100)包括励磁线圈单元,其周围环绕着励磁线圈(122)。用于使长的部件(190)沿通过方向(192)通过的通孔(112)和围绕该通孔放置的拾波线圈单元。拾取线圈单元包括沿着通道开口(112)的外围分布的两个或多个分段线圈单元(142-1 / 142-8),在每个分段线圈单元具有仅覆盖一部分表面的拾取区域。很长的部分。扇形线圈单元(142-1 / 142-8)沿着围绕通孔的两个外壳(S1,S2)分布,通道外壳以直通线圈单元的主轴(114)的不同距离(A1,A2)放置。此时,没有相互重叠的第一馈通线圈单元(142-1 / 142-4)被放置在第一壳体(S1)中,而没有相互交叠的第二馈通线圈单元(142-5 / 142-8)重叠的部分放置在第二壳中(S2)。第一馈通线圈单元和第二馈通线圈单元彼此相对放置,以使第二馈通线圈单元测量未被第一扇形线圈单元覆盖的外围区域。效果:高强度馈电的潜在发展直通线圈,可接收有关被测物体中可用缺陷和其他不均匀性的可靠且有益的测试结果。15 cl,7 dwg

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