Microscopy imaging device, imaging microscopy method and imaging microscopy program

摘要

An imaging microscopy apparatus is provided in which a measurement object can be easily captured using measurement light having a desired pattern, wherein the pattern of the measurement light can be changed and a phase of the pattern can be moved without providing a mechanical mechanism have to. A desired pattern of a plurality of patterns of the measurement light is instructed. The measuring light having a instructed pattern is generated by a light modulating element and applied to a measuring object. A spatial phase of the generated pattern is sequentially moved on the measurement object by a predetermined amount from the light modulation element. Multiple regions of patterned image data generated with respect to plural phases of the pattern are synthesized based on the light reception signal output from the light receiving section to generate partial image data indicative of an image of the measurement object.