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SCATTER SPECTRA METHOD FOR X-RAY FLUORESCENT ANALYSIS WITH OPTICAL COMPONENTS

机译:散射光谱法用于光学成分的X射线荧光分析

摘要

A method of measuring the transfer function of an X-ray optical component over a wide range of X-ray energies, which includes the steps of:using an X-ray optical component between an X-ray source and a scattering target to obtain a first scatter spectrum;obtaining a second scatter spectrum from the same or a similar target without the X-ray optical component between the X-ray source and the scattering target; andcalculating the transfer function by the ratio of the first scatter spectrum to the second scatter spectrum. The method can be used to improve the accuracy of X-ray quantitative methods in an apparatus where an X-ray optical component is used between the X-ray source and the specimen to be investigated by utilizing the method described above.
机译:一种在广泛的X射线能量范围内测量X射线光学组件传递函数的方法,该方法包括以下步骤:在X射线源和散射目标之间使用X射线光学组件,以获取第一散射光谱;从相同或相似的目标获得第二散射光谱,所述相同或相似的目标在X射线源与散射目标之间没有X射线光学成分。通过第一散射光谱与第二散射光谱的比值计算传递函数。在利用上述方法在X射线源与被检体之间使用X射线光学成分的装置中,可以使用该方法来提高X射线定量方法的精度。

著录项

  • 公开/公告号EP1521947A4

    专利类型

  • 公开/公告日2016-08-03

    原文格式PDF

  • 申请/专利权人 EDAX INC.;

    申请/专利号EP20030760459

  • 申请日2003-06-17

  • 分类号G01N23/223;G01D18;G01N23/20;G01N23/201;G01T;G01T1/36;G21K1/02;G21K1/06;G21K5/10;

  • 国家 EP

  • 入库时间 2022-08-21 14:53:14

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