首页> 外国专利> PHOTORESIST HAVING POSITIVE RESIST CHARACTERISTICS, PROCESS FOR PHOTOCHEMICAL STRUCTURING THEREOF, PROCESS FOR PREPARING SILANES AND SILICA (HETERO)POLY(CO)CONDENSATES HAVING POSITIVE RESIST CHARACTERISTICS AND SILICA (HETERO)POLY(CO)CONDENSATES

PHOTORESIST HAVING POSITIVE RESIST CHARACTERISTICS, PROCESS FOR PHOTOCHEMICAL STRUCTURING THEREOF, PROCESS FOR PREPARING SILANES AND SILICA (HETERO)POLY(CO)CONDENSATES HAVING POSITIVE RESIST CHARACTERISTICS AND SILICA (HETERO)POLY(CO)CONDENSATES

机译:具有正性的光致抗蚀剂,光化学结构的工艺,硅和二氧化硅(杂)多(CO)的制备过程具有正性的特性和二氧化硅(杂)多

摘要

The present invention relates to a special heteropolymer, namely a silicic acid (hetero)poly(co)condensate with positive-resist behavior which is distinguished by polycondensation or copolycondensation of specially modified silanes. The invention relates likewise to monomeric silanes from which the corresponding heteropolymers, i.e. the silicic acid (hetero)poly(co)condensates, can be produced. The silicic acid (hetero)poly(co)condensates according to the invention can be used for a photoresist which has positive-resist behavior. In addition, the invention relates to corresponding methods both for the production of the silanes, the silicic acid (hetero)poly(co)condensates or a method for photochemical structuring of the photoresist according to the invention which is based on the silicic acid (hetero)poly(co)condensates.
机译:本发明涉及一种特殊的杂聚物,即具有正抵抗行为的硅酸(杂)聚(共)缩合物,其特征在于特殊改性的硅烷的缩聚或共缩聚。本发明同样涉及单体硅烷,从中可以制备相应的杂聚物,即硅酸(杂)聚(共)缩合物。根据本发明的硅酸(杂)聚(共)缩合物可用于具有正抗蚀性能的光致抗蚀剂。另外,本发明涉及用于生产硅烷,硅酸(杂)聚(共)缩合物的相应方法或基于硅酸(杂)的根据本发明的光刻胶的光化学结构化方法。 )聚(共)缩合物

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