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Inspection visits support system

机译:视察访问支持系统

摘要

PROBLEM TO BE SOLVED: To support so that a medical examinee can perform inspection efficiently.SOLUTION: An examination reception support system comprises: a database 11 in which a reception parameter formed of plural determination ranks to plural inquiry items and/or inspection is associated for plural inspection items, and required inspection time required for inspection of the inspection item corresponding to every reception parameter, is stored; required inspection time acquisition means 13 for referring to the database 11 based on the inspection item of the medical examinee and reception parameter of the medical examinee, and acquiring the required inspection time required for the respective inspection of the medical examinee; inspection standby time acquisition means 14 for determining standby time to the inspection of the respective inspection item based on the required inspection time required for the respective inspection of the medical examinee; and inspection item order determination means 15 for determining an order of the inspection items which the medical examinee receives, based on the inspection items which the medical examinee receives and the standby time to inspection of the respective inspection item.
机译:解决的问题:支持以便医学检查者可以有效地执行检查。解决方案:检查接收支持系统包括:数据库11,其中由多个确定等级形成的接收参数与多个询问项相关联和/或检查,用于存储多个检查项目和与每个接收参数对应的检查项目的检查所需的检查时间。要求检查时间获取装置13,用于根据被检查者的检查项目和被检查者的接收参数,参照数据库11,取得对被检查者的各检查所需要的检查时间。检查等待时间获取装置14,用于基于对被检查者进行相应检查所需的检查时间来确定对相应检查项目进行检查的等待时间;检查项目顺序确定装置15,用于根据检查对象接收的检查项目和检查各检查项目的待机时间来确定检查对象接受的检查项目的次序。

著录项

  • 公开/公告号JP5984869B2

    专利类型

  • 公开/公告日2016-09-06

    原文格式PDF

  • 申请/专利权人 東芝情報システム株式会社;

    申请/专利号JP20140083719

  • 发明设计人 熊谷 幸乃;

    申请日2014-04-15

  • 分类号G06Q50/22;

  • 国家 JP

  • 入库时间 2022-08-21 14:42:26

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