首页> 外国专利> Rotating-Element Spectroscopic Ellipsometer and Method for Measurement Precision Prediction of Rotating-Element Spectroscopic Ellipsometer, Recording Medium Storing Program for Executing the Same, and Computer Program Stored in Medium for Executing the Same

Rotating-Element Spectroscopic Ellipsometer and Method for Measurement Precision Prediction of Rotating-Element Spectroscopic Ellipsometer, Recording Medium Storing Program for Executing the Same, and Computer Program Stored in Medium for Executing the Same

机译:旋转元件光谱椭偏仪及旋转元件光谱椭偏仪的测量精度预测方法,执行该记录仪的记录介质存储程序,以及存储在该程序中的计算机程序

摘要

Provided are a rotating-element spectroscopic ellipsometer and a method for measurement precision prediction of a rotating-element spectroscopic ellipsometer, a recording medium storing program for executing the same, and a computer program stored in a medium for executing the same, and more particularly, a rotating-element spectroscopic ellipsometer and a method for measurement precision prediction of a rotating-element spectroscopic ellipsometer capable of calculating the measurement precision of the rotating-element spectroscopic ellipsometer based on a theoretical equation on standard deviations of ellipsometric parameters for a sample, a recording medium storing program for executing the same, and a computer program stored in a medium for executing the same.
机译:本发明提供一种旋转式椭偏仪,旋转式椭偏仪的测量精度预测方法,用于执行该旋转式椭偏仪的记录介质存储程序,以及存储在用于执行该旋转式椭偏仪的介质中的计算机程序,尤其是,旋转椭偏仪,旋转椭偏仪的测量精度预测方法,该方法能够基于关于样品的椭偏参数的标准偏差的理论方程来计算旋转椭偏仪的测量精度,记录介质存储程序,用于执行该程序;以及计算机程序,存储在介质中,用于执行该程序。

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