Non-contact probe measurement test bed for millimeter wave and terahertz circuits, integrated devices/components, systems for spectroscopy using sub-wavelength-size-samples

摘要

A test fixture for characterizing a device-under-test (DUT) includes first and second planar antennas and a planar waveguide arranged to guide terahertz (THz) and/or millimeter wave (mmW) radiation between the first and second planar antennas. The planar waveguide is further configured to couple THz and/or mmW radiation guided between the first and second planar antennas with the DUT. A beam forming apparatus is arranged to transmit a probe THz and/or mmW radiation beam to the first planar antenna of the test fixture. An electronic analyzer is configured to wirelessly receive a THz and/or mmW signal emitted by the second planar antenna responsive to transmission of the probe THz and/or mmW radiation beam to the first planar antenna. The planar antennas may be asymmetrical beam-tilted slot antennas.