首页> 外国专利> BRAIN TISSUE POST-MORTEM DETECTION TECHNIQUES FOR PATHOMORPHOLOGIC BRAIN EXAMINATION IN CASE OF ENCEPHALOPATHY

BRAIN TISSUE POST-MORTEM DETECTION TECHNIQUES FOR PATHOMORPHOLOGIC BRAIN EXAMINATION IN CASE OF ENCEPHALOPATHY

机译:脑病患者的病理组织学检查的脑组织后事后检测技术

摘要

The invention relates to medicine, namely to pathomorphology, and it is associated with post-mortem pathomorphologic brain examination in cases of encephalopathy. The aim of the invention is to develop brain tissue post-mortem detection techniques for pathomorphologic brain examination in cases of encephalopathy, which would allow eliminating discrepancies and errors in post-mortem diagnosis of the disease. The goal is achieved by ensuring that during the pathomorphologic examination of post-mortem brain, it is removed from the skull, and the examination determines skull vault's largest span along the mid-line of the skull's inner surface CD, determines skull vault's largest span along the mid-line of the skull's outer surface GH, cuts a straight front-parietal line (starting from the frontal lobe) of the underside of the two hemispheres, exposing the brain's lateral and third ventricle, then placing it in the preparation bath, fixating both sides of the hemispheres and determining the outer distance between the brain's frontal horns AB, the distance along the midline EF of the lateral ventricle, and the ratio of the coefficient, thus determining post-mortem signs of encephalopathy.
机译:本发明涉及医学,即病理形态学,它与脑病患者的尸体病理形态学脑检查有关。本发明的目的是开发用于脑病病例的病理形态学脑检查的脑组织验尸检测技术,其将消除疾病的验尸诊断中的差异和错误。通过确保在验尸大脑的病理形态学检查过程中,将其从颅骨中取出,并确定颅骨穹顶沿颅骨内表面CD中线的最大跨度,确定颅骨穹顶沿颅骨的最大跨度,可以实现该目标。颅骨外表面GH的中线切开两个半球底侧的一条笔直的顶壁线(从额叶开始),露出大脑的侧脑室和第三脑室,然后将其置于准备浴中,固定在半球的两侧,并确定大脑额角AB之间的外部距离,沿侧脑室中线EF的距离以及系数的比率,从而确定脑病的验尸迹象。

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