APPARATUS FOR IN-SITU OBSERVATION OF PHASE TRANSITIONS OF PIEZOELECTRIC POLYMER FILMS DURING STRETCHING, XRD SYSTEM USING THEREOF

摘要

The present invention relates to a stretching apparatus for in situ XRD to measure a phase transition in real time while stretching a piezoelectric polymer film such as a PVDF film. The stretching apparatus comprises a tension unit to apply tension to a sample which is a piezoelectric polymer film whose at least one end is inserted and fixated on the tension unit. The sample is mounted on an equipment to measure a phase transition of the sample while stretching the sample by specific elongation to measure the phase transition of the piezoelectric polymer film by stretching the piezoelectric polymer film. Accordingly, the phase transition of the piezoelectric polymer film by stretching the piezoelectric polymer film is able to be measured in situ.