首页> 外国专利> GAMMA RAY SURVIVABILITY EVALUATING DEVICE OF INTEGRATED CIRCUIT ELEMENT AND EVALUATING METHOD THEREOF

GAMMA RAY SURVIVABILITY EVALUATING DEVICE OF INTEGRATED CIRCUIT ELEMENT AND EVALUATING METHOD THEREOF

机译:集成电路元件的伽玛射线能生存性评估装置及其评估方法

摘要

According to an embodiment of the present invention, a gamma ray survivability evaluating device of an integrated circuit element comprises: an integrated circuit element accommodating unit separated from a gamma ray source; light emitting diodes connected to a plurality of input terminals and a plurality of output terminals of the integrated circuit element accommodated in the integrated circuit element accommodating unit, respectively; and a camera configured to photograph flickering states of the light emitting diodes.;COPYRIGHT KIPO 2016
机译:根据本发明的实施例,一种集成电路元件的伽马射线生存性评估装置包括:与伽马射线源分离的集成电路元件容纳单元;以及与所述伽马射线源相分离的集成电路元件容纳单元。分别与容纳在集成电路元件容纳单元中的集成电路元件的多个输入端子和多个输出端子连接的发光二极管;以及配置为拍摄发光二极管闪烁状态的照相机。; COPYRIGHT KIPO 2016

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