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ELECTRIC DEFECTS ANALYZER DETECTING ALL DEFECTS IN PCB/MCM

机译:电缺陷分析仪检测PCB / MCM中的所有缺陷

摘要

A system for electric testing PCB/MCM before and after assembly. The system uses energy taken from a heating source, timely applied at certain ports of the PCB/MCM (entry ports). The energy is defused through the board inner layer tracks terminating at the end of the channel tracks of the PCB/MCM (exit ports). The rate of energy diffusion on the board is measured at the terminating ports in the time domain. The thermal emission is measured by a spectrometer that conducts infrared scans and analyzes the PCBs energy spectrum. Measurements can be taken as discrete measurements or as integrated measurements. The measurements results are compared with the pre-memorized values of a group of patterns that represent respective golden board. Defect analysis is automatically achieved based on learned defect test patterns.
机译:用于在组装前后对PCB / MCM进行电气测试的系统。系统使用从加热源获取的能量,并及时将其施加在PCB / MCM的某些端口(进入端口)上。能量通过在PCB / MCM通道迹线末端(出口)终止的电路板内层迹线释放。板上能量扩散的速率是在时域中的端接端口处测量的。用光谱仪测量热辐射,该光谱仪进行红外扫描并分析PCB的能谱。测量可以采取离散测量或集成测量。将测量结果与代表相应黄金板的一组图案的预先存储的值进行比较。根据学习到的缺陷测试模式自动进行缺陷分析。

著录项

  • 公开/公告号EP1668690B1

    专利类型

  • 公开/公告日2017-11-08

    原文格式PDF

  • 申请/专利权人 INVISIBLE LTD;

    申请/专利号EP20040770513

  • 发明设计人 GITMAN JACOB;DANKNER YAIR;PIKARY YIZHAK;

    申请日2004-09-14

  • 分类号G01R31/28;G01R31/309;H05K1/02;

  • 国家 EP

  • 入库时间 2022-08-21 14:07:41

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