首页> 外国专利> Microscopic image analysis method of coupled substance, microscope image analysis apparatus, and computer program

Microscopic image analysis method of coupled substance, microscope image analysis apparatus, and computer program

机译:耦合物质的显微图像分析方法,显微图像分析装置及计算机程序

摘要

PROBLEM TO BE SOLVED: To provide an image analysis method estimating characteristics of a bound substance by defining a ratio of a boundary between different phases adjacent to a constituent phase in the bound substance comprising a plurality of constituent phases.SOLUTION: The image analysis method defines the length of a boundary between different phases to which a constituent phase is adjacent from a sectional image of a bound substance comprising a plurality of constituent phases. The image analysis method of the bound substance comprising the plurality of phases includes the steps of: polishing the bound substance; microscopically capturing an image of a polished surface of the polished bound substance to create an image; defining a presence area of constituent phases in the bound substance on the basis of luminance distribution of the image; defining a boundary between different phases from the presence area of the defined constituent phases; and deriving a ratio of the boundary between the respective different phases.
机译:解决的问题:提供一种图像分析方法,该方法通过定义包括多个组成相的结合物质中与组成相相邻的不同相之间的边界比率来估计结合物的特性。从包括多个组成相的结合物质的截面图像来看,组成相相邻的不同相之间的边界的长度。包含多个相的结合物质的图像分析方法包括以下步骤:抛光结合物质;显微捕获抛光的结合物质的抛光表面的图像以产生图像;根据图像的亮度分布,定义结合物质中构成相的存在区域;从所定义的组成阶段的存在区域中定义不同阶段之间的边界;并推导各个不同相位之间的边界比率。

著录项

  • 公开/公告号JP6107388B2

    专利类型

  • 公开/公告日2017-04-05

    原文格式PDF

  • 申请/专利权人 新日鐵住金株式会社;

    申请/专利号JP20130095783

  • 发明设计人 木村 正雄;高山 透;

    申请日2013-04-30

  • 分类号G06T7/60;C22B1/16;G01N21/17;

  • 国家 JP

  • 入库时间 2022-08-21 13:54:56

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号