首页> 外国专利> METHOD FOR OBTAINING AT LEAST ONE STRUCTURE APPROXIMATING A SOUGHT STRUCTURE BY REFLOW

METHOD FOR OBTAINING AT LEAST ONE STRUCTURE APPROXIMATING A SOUGHT STRUCTURE BY REFLOW

机译:最小二乘近似求解求解结构的一种方法

摘要

A method for determining at least one reflow parameter for obtaining a structure approximating a sought structure by reflowing an initial structure different to the sought structure, the initial structure including at least one pattern formed in a thermo-deformable layer arranged on a substrate. The thermo-deformable layer forms a residual layer surrounding each pattern and from which each pattern extends such that each pattern has an interface only with the surrounding medium. The method includes: predicting progression over time of geometry of the initial structure subject to reflow, to obtain a plurality of predicted structures each associated with reflow parameters including at least a reflow time and a reflow temperature; computing correlation values of the geometry of each predicted structure with respect to the sought structure; identifying reflow parameters for obtaining the predicted structure offering a highest correlation value.
机译:一种用于确定至少一个回流参数的方法,该参数用于通过回流不同于所寻找结构的初始结构来获得近似所寻找结构的结构,该初始结构包括形成在布置在基板上的可热变形层中的至少一个图案。可热变形层形成围绕每个图案的残余层,并且每个图案从该残余层延伸,使得每个图案仅具有与周围介质的界面。该方法包括:预测经受回流的初始结构的几何形状随时间的进展,以获得多个预测结构,每个预测结构与包括至少回流时间和回流温度的回流参数相关联;以及计算每个预测结构相对于所寻找结构的几何相关值;确定回流参数以获得用于提供最高相关值的预测结构。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号