首页> 外国专利> PERSONALIZED SYSTEM FOR MARKING MOCK TEST AND ANALYZING QUESTIONS THROUGH GROUPING OF APPLICANTS AND METHOD THEREOF

PERSONALIZED SYSTEM FOR MARKING MOCK TEST AND ANALYZING QUESTIONS THROUGH GROUPING OF APPLICANTS AND METHOD THEREOF

机译:通过申请者分组进行个性化模拟测试和问题分析的个性化系统及其方法

摘要

The present invention relates to a system for marking a mock test and analyzing questions and a method thereof, and more specifically, to a personalized system for marking a mock test and analyzing questions through grouping of applicants, capable of improving learning efficiency by showing a correct answer ratio and an error answer ratio of each question to applicants applied for a mock test, and showing wrong questions, and to a method thereof. The system for marking a mock test and analyzing questions comprises: a test set database for storing a plurality of test sets; an applicant database; a test question issuing unit for selecting a test set from among the test sets and issuing a mock test; a correct or incorrect answer rate calculation unit for calculating a correct answer rate and an incorrect answer rate for each problem of the selected test set; and a correct or incorrect answer rate information output unit for displaying information on the percentage of correct answers and the percentage of incorrect answers for each question on the display device of each applicant.;COPYRIGHT KIPO 2017
机译:本发明涉及一种标记模拟考试并分析问题的系统及其方法,尤其涉及一种通过对申请人进行分组来标记模拟考试并分析问题的个性化系统,能够通过显示正确的答案来提高学习效率。各个问题对模拟考试的申请者的回答率和错误回答率及其显示错误的问题及其方法。用于标记模拟测试并分析问题的系统包括:测试集数据库,用于存储多个测试集;申请人数据库;测试问题发布单元,用于从测试集中选择测试集并发布模拟测试;正确或不正确的回答率计算单元,用于为所选测试集的每个问题计算正确的回答率和错误的回答率;正确率或不正确率信息输出单元,用于在每个申请人的显示设备上显示关于每个问题的正确答案的百分比和错误答案的百分比的信息。COPYRIGHTKIPO 2017

著录项

  • 公开/公告号KR20170004330A

    专利类型

  • 公开/公告日2017-01-11

    原文格式PDF

  • 申请/专利权人 CORP. GU EDUTAINMENT;

    申请/专利号KR20150094545

  • 发明设计人 BANG GYU SUNKR;

    申请日2015-07-02

  • 分类号G09B7/02;

  • 国家 KR

  • 入库时间 2022-08-21 13:28:24

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