AOI PCB Inspection device with AOI

摘要

The present invention suggests a tilting substrate inspection apparatus using AOI, which utilizes existing equipment and improves inspection efficiency. The tilting substrate inspection apparatus using AOI processes an object, which is difficult to inspect with an existing 2D AOI, by using the existing 2D AOI. To this end, the present invention relates to a substrate inspection apparatus comprising a vision device, and a transfer guide transferring a substrate to be inspected to a photographing part of the vision device. The tilting substrate inspection device using AOI can comprise: a tilting part controlling the oblique side of the substrate to face the photographing part of the vision device by tilting the transfer guide; and an inspection part determining whether a defect on the substrate is true or not through a photographed oblique image of a component.