Semiconductor memory device method for repairing bad column and setting method for setting redundant information thereof

摘要

The repair method of the present invention is a repair method that includes an address of a bad column, identification information for identifying a bad in either an even column or an odd column of a bad column, and an address of a redundant column of a redundant memory region for repairing a bad column Determining whether or not the column address of the selected column matches the address of the bad column based on the redundant information, and if it is determined that one of the bad columns in the bad column is a redundant column based on the identification information, Into one column of the redundant column, and not converting the other column having no defects in the bad column to another column of the redundant column.