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METHOD OF MEASUREMENT RELATIVE COMPLEX PERMITTIVITY OF MATERIAL WITH LOSSES IN MICROWAVE RANGE

机译:微波范围内有损耗材料的相对复介电常数的测量方法

摘要

FIELD: electricity.;SUBSTANCE: by means of microwave reflectometer the dependence of the Fresnel reflection coefficient of a flat material sample on the incidence angle is measured in the range from 40 to 90°, when the electric wave field is parallel to the incidence plane, and then, according to the plotting of the dependence of the Fresnel reflection coefficient on the incidence angle, the Brewster angle θv is determined, and the relative complex dielectric permittivity ε of a material sample or a ground surface portion is calculated by the formula ε= (tgθv)2.;EFFECT: providing the possibility of measuring the complex permittivity of flat samples larger compared to the wavelength in the microwave range.;4 dwg
机译:场:电;物质:当电场平行于入射平面时,通过微波反射计测量平面材料样品的菲涅耳反射系数对入射角的依赖性,其范围为40至90°然后,根据菲涅耳反射系数与入射角的关系图,确定布鲁斯特角θ v ,并确定材料样品或地面的相对复介电常数ε表面部分的计算公式为ε=(tgθ v 2 。效果:提供了测量平面样品的复介电常数的可能性,该样品的复介电常数大于微波范围。; 4 dwg

著录项

  • 公开/公告号RU2613810C1

    专利类型

  • 公开/公告日2017-03-21

    原文格式PDF

  • 申请/专利权人 VALEEV GEORGIJ GALIULLOVICH;

    申请/专利号RU20150142390

  • 发明设计人 VALEEV GEORGIJ GALIULLOVICH;

    申请日2015-10-06

  • 分类号G01R27/00;

  • 国家 RU

  • 入库时间 2022-08-21 13:23:38

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