首页>
外国专利>
Test pits measuring system for optical measurement of a test pits, method for the optical measurement of a test pits surface with such a test pits measuring system and use of such a test pits measuring system
Test pits measuring system for optical measurement of a test pits, method for the optical measurement of a test pits surface with such a test pits measuring system and use of such a test pits measuring system
The present invention relates to a test pits measuring system for optical measurement of a test pits surface (of), containinga) a measuring device (1) to the optical measurement of the test surface (of pits);b) a positioning device (2) for positioning of the measuring device (1) by means of the test surface (of pits),c) a in the measuring device (1) an integrated or externally to the measuring device (1), which is connected to the data processing unit (3); andd) a for controlling the interaction of the measuring device (1) and data processing unit (3) designed electronic control (4).According to the invention, it is provided thate) the measuring device (1) a projection unit (10) for the projection of a plurality of different two-dimensional pattern of pits on the test surface (of) and at least one camera (11) for receiving camera images of the test pits surface (of) made of defined camera receiving positions, wherein the data processing device (3) and the control (4) are formed and arranged in such a way, in order by means of a triangulation method from the camera images a topology of the test pits surface (of) to determine.Furthermore, the invention relates to a process for the optical measurement of a test pits surface, and the use of a test pits measuring system for the measurement of the surface topology of a deformed plate-shaped element, the one time state - compression test has been exposed to.
展开▼