首页> 外国专利> Test pits measuring system for optical measurement of a test pits, method for the optical measurement of a test pits surface with such a test pits measuring system and use of such a test pits measuring system

Test pits measuring system for optical measurement of a test pits, method for the optical measurement of a test pits surface with such a test pits measuring system and use of such a test pits measuring system

机译:用于对测试凹坑进行光学测量的测试凹坑测量系统,利用这样的测试凹坑测量系统对测试凹坑表面进行光学测量的方法以及这种测试凹坑测量系统的使用

摘要

The present invention relates to a test pits measuring system for optical measurement of a test pits surface (of), containinga) a measuring device (1) to the optical measurement of the test surface (of pits);b) a positioning device (2) for positioning of the measuring device (1) by means of the test surface (of pits),c) a in the measuring device (1) an integrated or externally to the measuring device (1), which is connected to the data processing unit (3); andd) a for controlling the interaction of the measuring device (1) and data processing unit (3) designed electronic control (4).According to the invention, it is provided thate) the measuring device (1) a projection unit (10) for the projection of a plurality of different two-dimensional pattern of pits on the test surface (of) and at least one camera (11) for receiving camera images of the test pits surface (of) made of defined camera receiving positions, wherein the data processing device (3) and the control (4) are formed and arranged in such a way, in order by means of a triangulation method from the camera images a topology of the test pits surface (of) to determine.Furthermore, the invention relates to a process for the optical measurement of a test pits surface, and the use of a test pits measuring system for the measurement of the surface topology of a deformed plate-shaped element, the one time state - compression test has been exposed to.
机译:本发明涉及一种用于对(一个)测试凹坑表面进行光学测量的测试凹坑测量系统,其包括:a)测量装置(1),对(一个凹坑)测试表面的光学测量; b)定位装置(2)。 )用于通过(凹坑的)测试表面将测量设备(1)定位,c)a在测量设备(1)中集成在测量设备(1)上或外部的测量设备(1),连接到数据处理单元(3); (d)用于控制测量装置(1)和设计为电子控制器(4)的数据处理单元(3)的相互作用。根据本发明,提供了(e)测量装置(1)和投影单元(10)。用于在(一个或多个)测试表面上投影多个不同的二维凹坑图案,并且至少一个照相机(11)用于接收由定义的照相机接收位置制成的(一个或多个)测试凹坑表面的照相机图像,其中数据处理装置(3)和控制装置(4)以这样的方式形成和布置,即,通过三角测量法,从照相机图像依次确定测试凹坑表面的拓扑。本发明涉及一种光学测试凹坑表面的方法,以及一种使用凹坑测量系统来测量变形的板状元件的表面拓扑的方法,该变形的板状元件已经经受了一次状态-压缩试验。

著录项

  • 公开/公告号DE102015118986A1

    专利类型

  • 公开/公告日2017-05-11

    原文格式PDF

  • 申请/专利权人 ANIX GMBH;

    申请/专利号DE201510118986

  • 发明设计人 MATTHIAS WEINGART;

    申请日2015-11-05

  • 分类号G01B11/25;

  • 国家 DE

  • 入库时间 2022-08-21 13:22:50

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