This characteristic measurement device is provided with: an optical frequency comb source (11); an optical frequency comb modulator (12) which, by phase modulation on each of the vertical modes of the optical frequency comb on the frequency axis, increases the repetition frequency of the pulse row configuring the optical frequency comb; a probe light irradiation system (13) which irradiates a sample (SMPL) with the optical frequency comb; a pump light irradiation system (14) which irradiates and optically excites the sample (SMPL); a detection light emission system (15) which emits, as transient absorption response light to a spectral detector, transmitted light or reflected light of the probe light irradiated onto the sample (SMPL); a reference light emission system (16) which emits, as reference light to the spectral detector, the optical frequency comb generated by the optical frequency comb source; and the spectral detector (17) which, from the transmitted probe light incident via the detection light emission system (15) and the reference light incident from the reference light irradiation emission system, detects the phase spectrum of the transient absorption response light.
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