首页> 外国专利> Surface plasmon resonance fluorescence analysis method, surface plasmon resonance fluorescence analysis apparatus and surface plasmon resonance fluorescence analysis system

Surface plasmon resonance fluorescence analysis method, surface plasmon resonance fluorescence analysis apparatus and surface plasmon resonance fluorescence analysis system

机译:表面等离子体共振荧光分析方法,表面等离子体共振荧光分析装置和表面等离子体共振荧光分析系统

摘要

[Problem] To provide a surface plasmon resonance fluorescence analysis method, a surface plasmon resonance fluorescence analysis device, and a surface plasmon resonance fluorescence analysis system that can shorten as much as possible the time needed for examination in a case where a plurality of test chips are examined, that do not require the device to be made large, and that can inexpensively perform examination. [Solution] In the present invention, when examining a plurality of test chips, test chips are inserted into a plurality of test chip insertion openings of a fluorescence analysis device in which the insertion openings are formed, and firstly an initial measurement step for a first test chip is performed, and thereafter an initial measurement step for a second test chip is performed so that if multiple examinations are performed, an optical system is effectively utilized. A test chip for which the initial measurement step has been completed is sequentially subjected to a primary reaction step, a secondary reaction step, and a signal measurement step after the initial measurement step has been completed. By carrying out examination in such a sequence, it is possible to reduce examination time.
机译:[问题]为了提供一种表面等离子体共振荧光分析方法,表面等离子体共振荧光分析装置以及表面等离子体共振荧光分析系统,能够在多个测试芯片的情况下尽可能地缩短检查所需的时间。进行检查,不需要将设备做大,并且可以廉价地进行检查。 [解决方案]在本发明中,当检查多个测试芯片时,将测试芯片插入到形成有插入开口的荧光分析装置的多个测试芯片插入开口中,首先进行用于第一步骤的初始测量步骤。执行测试芯片,然后执行第二测试芯片的初始测量步骤,以便如果执行多次检查,则可以有效利用光学系统。在初始测量步骤完成之后,将已经完成初始测量步骤的测试芯片顺序地进行初级反应步骤,次级反应步骤和信号测量步骤。通过以这种顺序进行检查,可以减少检查时间。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号