首页> 外国专利> SYSTEM AND METHOD SUPPORTING EXPLORATORY ANALYTICS FOR KEY PERFORMANCE INDICATOR (KPI) ANALYSIS IN INDUSTRIAL PROCESS CONTROL AND AUTOMATION SYSTEMS OR OTHER SYSTEMS

SYSTEM AND METHOD SUPPORTING EXPLORATORY ANALYTICS FOR KEY PERFORMANCE INDICATOR (KPI) ANALYSIS IN INDUSTRIAL PROCESS CONTROL AND AUTOMATION SYSTEMS OR OTHER SYSTEMS

机译:支持工业过程控制和自动化系统或其他系统中关键绩效指标(KPI)分析的探索性分析的系统和方法

摘要

A method includes receiving information associated with industrial equipment from multiple data sources. The information includes different types of information related to the industrial equipment and is received from at least two different types of data sources. The method also includes executing exploratory analysis routines using at least some of the received information and generating one or more displays identifying results of the exploratory analysis routines. At least one of the exploratory analysis routines uses key performance indicator (KPI) data associated with the industrial equipment. At least one of the exploratory analysis routines includes logic defined by at least one user associated with the industrial equipment and uses data that is retrieved based on input from the at least one user.
机译:一种方法包括从多个数据源接收与工业设备相关的信息。该信息包括与工业设备有关的不同类型的信息,并且是从至少两种不同类型的数据源接收的。该方法还包括使用所接收的信息中的至少一些来执行探索性分析例程,以及生成一个或多个标识探索性分析例程的结果的显示。探索性分析例程中的至少一个使用与工业设备关联的关键绩效指标(KPI)数据。探索性分析例程中的至少一个包括由与工业设备相关联的至少一个用户定义的逻辑,并且使用基于来自至少一个用户的输入而检索到的数据。

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