ABNORMALITY DETECTION DEVICE FOR STRUCTURE, ABNORMALITY DETECTION SYSTEM FOR STRUCTURE, ABNORMALITY DETECTION METHOD FOR STRUCTURE, AND ABNORMALITY DETECTION PROGRAM FOR STRUCTURE

摘要

PROBLEM TO BE SOLVED: To detect an abnormality of a structure with accuracy.;SOLUTION: An abnormality detection device 100 is provided with a first accelerometer 31, a second accelerometer 32, an acquisition part 101, a conversion part 102, and a detector 106. The first accelerometer 31 is arranged in a structure 4. The second accelerometer 32 is arranged in the structure 4 at a location below the first accelerometer 31 spaced by a prescribed distance or more from the first accelerometer 31. The acquisition part 101 acquires, from each of the first accelerometer 31 and the second accelerometer 32, vibration data G1, G2 of the prescribed direction. The conversion part 102 performs Fourier conversion on the vibration data G1, G2. The detector 106 detects an occurrence of an abnormality of the structure 4 on the basis of a first spectrum F1 and a second spectrum F2 generated by the conversion part 102. The structure 4 is supported at least at its bottom end. The first spectrum F1 corresponds to the vibration data G1 of the first accelerometer 31. The second spectrum F2 corresponds to the vibration data G2 of the second accelerometer 32.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2019,JPO&INPIT