首页> 外国专利> X-ray detector for phase contrast and / or dark field imaging, interferometer having the X-ray detector, X-ray imaging system, method for performing phase contrast X-ray imaging and / or dark field X-ray imaging, and computer program , Computer readable media

X-ray detector for phase contrast and / or dark field imaging, interferometer having the X-ray detector, X-ray imaging system, method for performing phase contrast X-ray imaging and / or dark field X-ray imaging, and computer program , Computer readable media

机译:用于相衬和/或暗场成像的X射线探测器,具有X射线探测器的干涉仪,X射线成像系统,用于执行相衬X射线成像和/或暗场X射线成像的方法以及计算机程序,计算机可读媒体

摘要

The present invention relates to X-ray imaging. In order to reduce X-ray dose exposure during X-ray image acquisition, an X-ray detector is provided that is suitable for phase contrast and/or dark-field imaging. The X-ray detector comprises a scintillator layer (12) and a photodiode layer (14). The scintillator layer is configured to convert incident X-ray radiation (16) modulated by a phase grating structure (18) into light to be detected by the photodiode layer. The scintillator layer comprises an array of scintillator channels (20) periodically arranged with a pitch (22) forming an analyzer grating structure. The scintillator layer and the photodiode layer form a first detector layer (24) comprising a matrix of pixels (26). Each pixel comprises an array of photodiodes (28), each photodiode forming a sub-pixel (30). Adjacent sub-pixels during operation receive signals having mutually shifted phases. The sub-pixels that during operation receive signals having mutually identical phase form a phase group per pixel. The signals received by the sub-pixels within the same phase group per pixel during operation are combined to provide one phase group signal (32). The phase group signals of different phase groups during operation are obtained in one image acquisition. In an example, the pitch of the scintillator channels is detuned by applying a correcting factor c to a fringe period (Pfringe) of a periodic interference pattern (35) created by the phase grating structure, wherein 0c2.
机译:X射线成像技术领域本发明涉及X射线成像。为了减少在X射线图像采集期间的X射线剂量暴露,提供了一种X射线检测器,其适合于相衬和/或暗场成像。 X射线探测器包括闪烁体层(12)和光电二极管层(14)。闪烁体层被配置为将由相位光栅结构(18)调制的入射X射线辐射(16)转换为将由光电二极管层检测的光。闪烁体层包括闪烁体通道(20)的阵列,所述闪烁体通道(20)周期性地以间距(22)布置,从而形成分析仪光栅结构。闪烁体层和光电二极管层形成包括像素矩阵(26)的第一检测器层(24)。每个像素包括光电二极管阵列(28),每个光电二极管形成子像素(30)。在操作期间,相邻的子像素接收具有相互偏移的相位的信号。在操作期间接收具有彼此相同的相位的信号的子像素每个像素形成一个相位组。在操作期间,由每个像素在相同相位组内的子像素接收的信号被组合以提供一个相位组信号(32)。在一个图像采集中获得操作期间不同相位组的相位组信号。在一个示例中,通过将校正因子c应用于由相位光栅结构产生的周期性干涉图案(35)的条纹周期(Pfringe),来使闪烁器通道的间距失谐,其中0 <c <2。

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