Problem tendency prediction system and question tendency prediction method

摘要

An object of the present invention is to provide a technique for well supporting prediction of test questions. SOLUTION: Question data which is data concerning a plurality of problems in a plurality of tests in the past, and data of a plurality of candidate prediction model types determined in advance are held, and at least one test is a prediction target for model selection Assume that the question data of the test before the test to be predicted for model selection is the prediction input for model selection, and the model using the candidate prediction model constructed by learning the question data for a plurality of candidate prediction model types It predicts the questioning tendency of the prediction target for model selection from the prediction input for selection, calculates the index of the similarity between the predicted questioning tendency and the actual questioning tendency of the prediction target for model selection, and calculates the index for each candidate prediction model format Based on the application prediction model type to be used to predict the test tendency of future tests based on the application prediction model according to the application prediction model type, the question data of past tests As input, to predict the questions trend of the future of the test. [Selected figure] Figure 1