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III-V compound semiconductor substrate and III-V compound semiconductor substrate with epitaxial layer
III-V compound semiconductor substrate and III-V compound semiconductor substrate with epitaxial layer
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机译:具有外延层的III-V族化合物半导体衬底和III-V族化合物半导体衬底
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摘要
The InP substrate, which is a III-V compound semiconductor substrate, has 0.29 particles / cm 2 or less in particle diameter or 20 particles / cm 2 or less in particle diameter of 0.079 μm or less on the main surface. Include. The epilayer-attached InP substrate, which is an epilayer-attached III-V compound semiconductor substrate, includes the above-described InP substrate and an epitaxial layer disposed on the main surface of the InP substrate, and the thickness of the epitaxial layer is 0.3 μm. When the main surface of this case contains 10 LPDs with an equal area circle diameter of 0.24 μm or more at 10 pieces / cm 2 or less or 30 LPDs with an equal area circle diameter of 0.136 μm or more at 30 pieces / cm 2 or less. Thus, a III-V compound semiconductor substrate and an epilayer-attached III-V compound semiconductor substrate capable of reducing defects in an epitaxial layer grown on the main surface are provided.
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机译:作为III-V族化合物半导体基板的InP基板的主表面的粒径为0.29个/ cm 2以下,粒径为0.079μm以下,为20个/ cm 2以下。包括。作为附有外延层的III-V族化合物半导体衬底的附有外延层的InP衬底包括上述InP衬底和设置在InP衬底的主表面上的外延层,并且外延层的厚度为0.3微米当该情况的主表面包含10个/ cm 2以下时,等面积圆直径为0.24μm以上的10个LPD或30个/ cm 2以下时,等面积圆直径为0.136μm以上的30个LPD或减。因此,提供了能够减少在主表面上生长的外延层中的缺陷的III-V族化合物半导体衬底和附有外延层的III-V族化合物半导体衬底。
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