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INQUIRY EXAMINATION SUPPORT SYSTEM, INQUIRY EXAMINATION SUPPORT METHOD, AND INQUIRY EXAMINATION SUPPORT PROGRAM
INQUIRY EXAMINATION SUPPORT SYSTEM, INQUIRY EXAMINATION SUPPORT METHOD, AND INQUIRY EXAMINATION SUPPORT PROGRAM
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机译:查询考试支持系统,查询考试支持方法和查询考试支持程序
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摘要
PROBLEM TO BE SOLVED: To examine an inquiry specification requested by a customer prior to order acceptance, and to provide support for more broadly retrieving past manufacturing results when examining a manufacturing propriety of the inquiry even if the inquiry deviates largely from the past manufacturing results.SOLUTION: In a computing machine, conditions and test results related to past manufacturing results are registered as a manufacturing result database (S1). A condition requested for an inquiry specification is registered (S2). A retrieved manufacturing result is extracted from the manufacturing result database on the basis of the inquiry specification (S3). When the retrieved manufacturing result is not more than a lowest manufacturing result value or when a signal for requesting relaxation is inputted from an input part, the inquiry specification item is relaxed and a similar manufacturing result is extracted (S4 to 6). When the similar manufacturing result is not less than a largest manufacturing result value or when a signal for requesting restriction is inputted from the input part, the inquiry specification item is restricted and the retrieved manufacturing result is extracted (S7 to 9).SELECTED DRAWING: Figure 2
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