Optical module and link operationanalysis and failure prediction

摘要

Embodiments include techniques for device analysis and failure prediction, the techniques include measuring or collecting parametric data of the device at a configurable interval, wherein the parametric data includes one or more parameters, and receiving operating limits for the parametric data based on specifications or characteristics for the device. The techniques also include determining a trend of the measured or collected parametric data of the device, and filtering noise from the trend based at least in part on at least one of other devices exhibiting a deviation exhibited by the device or system state changes associated with system log files. The techniques include identifying a failure stage of the device based on at least one of the trend or the received operating limits, and transmitting a notification of a predicted failure based at least in part on the identification.