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Identification, quantification and prediction of free silicon in geological formation and its contribution to rock properties

机译:地质构造中游离硅的鉴定,定量和预测及其对岩石性质的贡献

摘要

Predicting and quantifying free silicon in a geological formation generates free silicon data for a physical sample obtained from within the geological formation. The free silicon data include identification of portions of the physical sample containing free silicon and a quantification of the free silicon contained in the portions of the physical sample containing free silicon. A modified petro-elastic model for the geological formation comprising rock constituents is generated that incorporates free silicon as one of the rock constituents and that quantitatively models how free silicon changes elastic properties within the geological formation. A three-dimensional model of the geological formation is created that indicates volumes of free silicon throughout the geological formation. The three-dimensional model is created using geophysical data obtained from the physical sample, seismic data covering the geological formation and the modified petro-elastic model.
机译:预测和量化地质构造中的游离硅会生成从地质构造中获取的物理样品的游离硅数据。游离硅数据包括对包含游离硅的物理样品部分的标识以及对包含游离硅的物理样品部分中包含的游离硅的定量。生成了包含岩石成分的地质岩层的修改后的石油弹性模型,该模型结合了游离硅作为岩石成分之一,并定量地模拟了游离硅如何改变地质岩层内的弹性。创建了地质构造的三维模型,该模型指示了整个地质构造中游离硅的体积。使用从物理样本获得的地球物理数据,覆盖地质构造的地震数据和修改后的石油弹性模型创建三维模型。

著录项

  • 公开/公告号US10184906B2

    专利类型

  • 公开/公告日2019-01-22

    原文格式PDF

  • 申请/专利权人 CGG SERVICES SAS;

    申请/专利号US201615559490

  • 申请日2016-05-04

  • 分类号G01N23/22;E21B43/30;E21B49/00;G01V99/00;G01N23/225;G01N33/24;E21B41/00;E21B49/02;E21B25/00;

  • 国家 US

  • 入库时间 2022-08-21 12:11:42

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