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Direct electrical detection of current-induced spin polarization due to spin-momentum locking in topological insulators
Direct electrical detection of current-induced spin polarization due to spin-momentum locking in topological insulators
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机译:直接电检测由于拓扑绝缘子中的自旋动量锁定而引起的电流感应自旋极化
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摘要
A method for directly electrically generating and detecting spin polarization in topological insulators comprising depositing a first and fourth contact on a layer of Bi2Se3 and applying a current between the contacts, which creates a net spin polarization due to spin-momentum locking. A second (comprising ferromagnet/tunnel barrier) and third contact are deposited for detecting the spin polarization. A device for directly electrically generating and detecting the current-generated spin polarization in topological insulators, comprising a first and fourth contact on a layer of Bi2Se3 and a second contact comprising a ferromagnet/oxide tunnel barrier contact as a detector, and a third contact comprising nonmagnetic metal as a reference contact, a current to the first and fourth contact to produce a net spin polarization, and the spin polarization manifesting as a voltage between the second (magnetic) and third (reference) contacts.
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机译:一种在拓扑绝缘体中直接产生和检测自旋极化的方法,该方法包括在Bi 2 Sub> Se 3 Sub>层上沉积第一触点和第四触点,并在触点之间施加电流,由于自旋动量锁定,产生净自旋极化。沉积第二接触点(包括铁磁体/隧道势垒)和第三接触点以检测自旋极化。一种直接在拓扑绝缘体中电产生和检测电流产生的自旋极化的装置,该装置包括在Bi 2 Sub> Se 3 Sub>层上的第一和第四触点以及第二触点包括铁磁体/氧化物隧道势垒触点作为检测器,以及第三触点,该第三触点包括非磁性金属作为参考触点,流向第一和第四触点的电流以产生净自旋极化,并且自旋极化表现为第二电极之间的电压(磁性)和第三(参考)触点。
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