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SUB-PIXEL DISPLACEMENT MEASUREMENT METHOD BASED ON TIKHONOV REGULARIZATION

机译:基于蒂霍诺夫正则化的亚像素位移测量方法

摘要

Disclosed is a sub-pixel displacement measurement method based on Tikhonov regularization. In a digital image correlation method, a grayscale gradient of a speckle pattern needs to be obtained when sub-pixel displacement of the speckle pattern is calculated. In a traditional calculation method, derivation is carried out for a grayscale of the speckle pattern by means of a finite difference method; however, numerical value derivation is highly unstable and is very sensitive to image noise, and a tiny measurement error can cause the grayscale gradient obtained by means of calculation to seriously deviate from a real grayscale gradient. With regard to this problem, a sub-pixel displacement measurement method based on Tikhonov regularization is provided. In the method, a grayscale of a speckle pattern is fitted by using a smooth cubic spline function, a grayscale gradient of the speckle pattern is the derivative of a cubic spline, and thus, sub-pixel displacement of a structure is obtained by using the sub-pixel displacement measurement method, thereby solving the problem of the poor noise resistance capability of traditional measurement methods, and being capable of effectively improving the measurement accuracy.
机译:公开了一种基于Tikhonov正则化的亚像素位移测量方法。在数字图像相关方法中,当计算斑点图案的子像素位移时,需要获得斑点图案的灰度梯度。在传统的计算方法中,通过有限差分法对斑点图案的灰度进行推导。但是,数值推导非常不稳定并且对图像噪声非常敏感,微小的测量误差会导致通过计算获得的灰度梯度严重偏离真实的灰度梯度。针对这个问题,提供了一种基于Tikhonov正则化的子像素位移测量方法。在该方法中,通过使用平滑三次样条函数拟合斑点图案的灰度,斑点图案的灰度梯度是三次样条的导数,因此,通过使用散斑图案获得结构的亚像素位移。亚像素位移测量方法,解决了传统测量方法抗噪声能力差的问题,能够有效提高测量精度。

著录项

  • 公开/公告号WO2019037450A1

    专利类型

  • 公开/公告日2019-02-28

    原文格式PDF

  • 申请/专利权人 SOUTHEAST UNIVERSITY;

    申请/专利号WO2018CN83370

  • 发明设计人 HE DINGDING;ZHENG CHENGLIN;FEI QINGGUO;

    申请日2018-04-17

  • 分类号G06T7;

  • 国家 WO

  • 入库时间 2022-08-21 11:56:28

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