MATERIALS SCLEROMETRIC RESEARCH METHOD FOR THE MICRO-STRUCTURE PARAMETERS CHANGING AND DEVICE FOR ITS IMPLEMENTATION

摘要

FIELD: monitoring and measurement equipment.;SUBSTANCE: invention relates to the scanning methods and devices designed for the metals and alloys surface layers microstructure studying, but can also be used to study any materials with the heterogeneous structure. Performing the indenter scanning (movement) on the material under study surface at a constant speed and at a constant load. along a circular path using a drum, in which with a certain offset from the center of rotation an indenter with a diamond tip is attached, wherein performing the indenter movement so that the indenter movement starting point coincides with the scanning end point, at that, the drum rotation first cycle is used to clear the scanning path, and the measurements begin with any of the drum rotation subsequent cycles. Device includes electric motor, loading device with the holder and the holder mounted indenter. Electric motor is attached in a cylindrical housing with fasteners, is configured to transmit the shaft rotation to the drum through the reduction gear, in which, with the certain displacement from the rotation center, the spring loading device, the indenter with a diamond tip and the fastening nut are located.;EFFECT: scanning device relative simplicity, increase in its reliability, as well as increase in the measurements accuracy, possibility of located at different depths thin surface layers microstructure properties volumetric picture obtaining.;7 cl, 4 dwg