首页> 外国专利> SCATTERED RADIATION INTENSITY CALCULATION DEVICE, SCATTERED RADIATION CORRECTION DEVICE EQUIPPED WITH THE SAME, AND SCATTERED RADIATION INTENSITY CALCULATION METHOD

SCATTERED RADIATION INTENSITY CALCULATION DEVICE, SCATTERED RADIATION CORRECTION DEVICE EQUIPPED WITH THE SAME, AND SCATTERED RADIATION INTENSITY CALCULATION METHOD

机译:散射辐射强度计算装置,配备有散射辐射强度校正装置的散射辐射校正装置和散射辐射强度计算方法

摘要

To provide a scattered radiation intensity calculation device that is applicable even when arbitrary different living bodies are subjects.SOLUTION: A scattered radiation intensity calculation device includes a storage unit and a calculation unit. The storage unit stores parameters of a curve equation indicating relationships between a ratio of a calculation result of scattered radiation intensity to entire radiation intensity in a specific frame at a specific pixel position on a detector used in X-ray imaging of a subject, and a ratio of entire radiation intensity detected at the specific pixel position in the X-ray imaging of the subject in the specific frame to entire radiation intensity detected at the specific pixel position in X-ray imaging with no subject in the specific frame. The calculation unit calculates a ratio of the scattered radiation intensity to entire radiation intensity detected in the X-ray imaging of the subject or direct radiation intensity in the specific frame at the specific pixel position using the curve equation.SELECTED DRAWING: Figure 32
机译:提供一种即使在任意不同的生物是被摄体的情况下也适用的散射辐射强度计算装置。解决方案:散射辐射强度计算装置包括存储单元和计算单元。存储单元存储曲线方程的参数,该曲线方程指示在用于对象的X射线成像的检测器上的特定像素位置处的特定帧中的特定框架中的散射辐射强度的计算结果与总辐射强度的比率之间的关系。在特定帧中的对象的X射线成像中的特定像素位置处检测到的总辐射强度与在特定帧中没有对象的X射线成像中的特定像素位置处检测到的总辐射强度之比。计算单元使用曲线方程式计算对象的X射线成像中检测到的散射辐射强度与总辐射强度之比或特定像素位置处特定帧中的直接辐射强度。

著录项

  • 公开/公告号JP2020014519A

    专利类型

  • 公开/公告日2020-01-30

    原文格式PDF

  • 申请/专利权人 ASAHI ROENTGEN KOGYO KK;

    申请/专利号JP20180137474

  • 发明设计人 MASAOKA KIYOSHI;

    申请日2018-07-23

  • 分类号A61B6;

  • 国家 JP

  • 入库时间 2022-08-21 11:36:01

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