首页> 外国专利> SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING POWER CONVERTER

SILICON CARBIDE SEMICONDUCTOR DEVICE, POWER CONVERTER, METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING POWER CONVERTER

机译:碳化硅半导体器件,功率转换器,制造硅碳化硅半导体器件的方法以及制造功率转换器的方法

摘要

A drift layer is formed of silicon carbide and has a first conductivity type. A trench bottom protective layer is provided on a bottom portion of a gate trench and has a second conductivity type. A depletion suppressing layer is provided between a side surface of the gate trench and the drift layer, extends from a lower portion of a body region up to a position deeper than the bottom portion of the gate trench, has the first conductivity type, and has an impurity concentration of the first conductivity type higher than that of the drift layer. The impurity concentration of the first conductivity type of the depletion suppressing layer is reduced as the distance from the side surface of the gate trench becomes larger.
机译:漂移层由碳化硅形成并且具有第一导电类型。沟槽底部保护层设置在栅极沟槽的底部上,并且具有第二导电类型。耗尽抑制层设置在栅极沟槽的侧表面和漂移层之间,从体区的下部延伸到比栅极沟槽的底部更深的位置,并且具有第一导电类型,并且具有第一导电类型的杂质浓度高于漂移层的杂质浓度。随着距栅沟槽的侧面的距离变大,耗尽抑制层的第一导电类型的杂质浓度降低。

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