FAILURE MODE STUDY BASED ERROR CORRECTION

摘要

A method for error correction in a memory system includes determining a bit error ratio for a memory block of the memory system during a read operation. The method further includes determining whether the bit error ratio is between a first threshold and a second threshold. The method further includes based on a determination that the bit error ratio is between the first threshold and the second threshold, performing a select gate drain (SGD) read operation on a SGD word line of the memory block. The method further includes generating first soft bit data using SGD data corresponding to the SGD read operation. The method further includes performing a low-density parity-check correction using the first soft bit data on the memory block.