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Systems and Methods for Optimizing Magnetic Torque and Pulse Shaping for Reducing Write Error Rate in Magnetoelectric Random Access Memory

机译:优化磁转矩和脉冲整形以降低磁电随机存取存储器中写入错误率的系统和方法

摘要

Systems and methods for reducing write error rate in MeRAM applications in accordance with various embodiments of the invention are illustrated. One embodiment includes a method for a writing mechanism for a magnetoelectric random access memory cell, the method including applying a voltage of a given polarity for a given period of time across a magnetoelectric junction bit of the magnetoelectric random access memory cell, wherein application of the voltage of the given polarity across the magnetoelectric junction bit reduces the perpendicular magnetic anisotropy and magnetic coercivity of the ferromagnetic free layer through a voltage controlled magnetic anisotropy effect, and lowering the applied voltage of the given polarity before the end of the given period of time, wherein the given period of time is approximately half of a precessional period of the ferromagnetic free layer.
机译:示出了根据本发明的各种实施例的用于减少MeRAM应用中的写错误率的系统和方法。一个实施例包括一种用于磁电随机存取存储单元的写入机制的方法,该方法包括在磁电随机存取存储单元的磁电结位上施加给定时间的给定极性的电压一段给定时间。磁电结位两端的给定极性的电压通过电压控制的磁各向异性效应减小了铁磁自由层的垂直磁各向异性和磁矫顽力,并在给定时间段结束之前降低了给定极性的施加电压,其中给定的时间大约是铁磁自由层的进动时间的一半。

著录项

  • 公开/公告号US2020035282A1

    专利类型

  • 公开/公告日2020-01-30

    原文格式PDF

  • 申请/专利权人 INSTON INC.;

    申请/专利号US201916591293

  • 发明设计人 ALBERT LEE;HOCHUL LEE;

    申请日2019-10-02

  • 分类号G11C11/16;H01F10/32;H01L43/02;H01L27/22;H01L43/10;

  • 国家 US

  • 入库时间 2022-08-21 11:20:00

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